Reviewed Journals

  1. G.K. Das, C.S. Bonifacio, J. De Rojas, K. Liu, K. van Benthem, I.M. Kennedy
    Ultra-long Magnetic Nanochains for Highly Efficient Arsenic Removal from Water
    Journal of Materials Chemistry A (2014)
  2. S.K. Kim, M.J. Shin, R. Rufner, K. van Benthem, J.H. Yu, S. Kim
    Sr0.95Fe0.5Co0.5O3−δ–Ce0.9Gd0.1O2−δ dual-phase membrane: Oxygen permeability, phase stability, and chemical compatibility
    Journal of Membrane Science 462 (2014) 153-159
  3. J.F. Rufner, R.H.R. Castro, T.B. Holland, K. van Benthem
    Mechanical properties of individual MgAl2O4 agglomerates and their effects on densification
    Acta materialia 69 (2014) 187-195
  4. H. Najar, A. Thron, C. Yang, S. Fung, K. van Benthem, L. Lin, D.A. Horsley
    Increased thermal conductivity polycrystalline diamond for low-dissipation micromechanical resonators
    IEEE 27th International Conference on Micro Electro Mechanical Systems (2014) 628-631
  5. J.F. Rufner, C.S. Bonifacio, T.B. Holland, A.K. Mukherjee, R.H.R. Castro, K. van Benthem
    Local current-activated growth of individual nanostructures with high aspect ratios
    Materials Research Letters 2 (2014) 10-15
  6. A.M. Thron, P. Green, K. Liu, K. van Benthem
    In-Situ Observation of Equilibrium Transitions in Ni films; Agglomeration and Impurity Effects
    Ultramicroscopy 137 (2014) 55-65
  7. C.S. Bonifacio, T.B. Holland, K. van Benthem
    Time dependent dielectric breakdown of surface oxides during electric field-assisted sintering
    Acta materialia 63 (2014) 140
  8. C.S. Bonifacio, T.B. Holland, K. van Benthem
    Evidence for Surface Cleaning during Electric Field Assisted Sintering
    Scripta materialia 69 (2013) 769-772
  9. C.-H. Chang, J.F. Rufner, K. van Benthem, R.H.R. Castro
    Design of desintering in tin dioxide nanoparticles
    Chemistry of Materials 25 (2013) 4262-4268
  10. A. Tavakoli, P.S. Maram, S. Widgeon, J. Rufner, K. van Benthem, S. Ushakov, S. Sen, A. Navrotsky
    Amorphous Alumina Nanoparticles: Structure, Surface Energy and Thermodynamic Phase Stability
    The Journal of Physical Chemistry C 117 (2013) 17123-17130
  11. J.F. Rufner, D. Anderson, K. van Benthem, R.H.R. Castro
    Synthesis and sintering behavior of ultrafine (< 10 nm) magnesium aluminate spinel nanoparticles
    J. Amer. Ceram. Soc. 96 (2013) 2077
  12. J. Chan, M. Balakchiev, A. Thron, R. A. Chapman, D. Riley, S.C. Song, A. Jain, J. Blatchford, J. Shaw, K. van Benthem, C.L. Hinkle, E.M. Vogel
    PtSi Dominated Schottky Barrier Heights of Ni(Pt)Si Contacts Due to Pt Segregation
    Appl. Phys. Lett. 102 (2013) 123507
  13. A.M. Thron, T.J. Pennycook, J. Chan, A. Jain, D. Riley, J. Blatchford, J. Shaw, E.M. Vogel, C.L Hinkle, K. van Benthem
    Formation of pre-silicide layers below Ni1-xPtxSi/Si interfaces and the effects on Schottky barrier heights
    Acta materialia 61 (2013) 2488
  14. C.S. Bonifacio, J.F. Rufner, T.B. Holland, K. van Benthem
    In situ transmission electron microscopy study of dielectric breakdown of surface oxides during electric field-assisted sintering of nickel nanoparticles
    Appl. Phys. Lett. 101 (2012) 093107
  15. C.S. Bonifacio, K. van Benthem,
    Time dependent soft dielectric breakdown of thermally grown SiO2 dielectrics
    J. Appl. Phys. 112 (2012) 103513
  16. M. Matsuno, C.S. Bonifacio, T.B. Holland, A.K. Mukherjee, K. van Benthem,
    In situ characterization of reduction reactions during sintering of nanocrystalline nickel
    Journal of Materials Research 27 (2012) 2431-2440
  17. S. Schwarz, A.M. Thron, K. van Benthem, Olivier Guillon
    Effect of Heating Rate on the Low Temperature Sintering of Nanocrystalline Zinc Oxide
    J. Amer. Ceram. Soc.
    , 95 (2012) 2451-2457
  18. A.M. Thron, P. Greene, K. Liu, K. van Benthem
    Ultrathin Films of Ni on Silicon far from Thermodynamic Equilibrium
    Acta Materialia 60 (2012) 2668-2678 
  19. S. Hayun, T.B. Tran, S.V. Ushakov, A.M. Thron, K. van Benthem, A. Navrotsky, and R.H.R. Castro
    Experimental methodologies for assessing the surface energy of highly hygroscopic materials: The case of nanocrystalline magnesia
    J. Chem. Phys. C 115 (2011) 23929 
  20. S.J. Pennycook, K. van Benthem, S.H. Oh, S.I. Molina, A.Y. Borisevich, W. Luo, S.T. Pantelides
    Seeing inside materials by aberration-corrected electron microscopy
    Int. J. of Nanotechnol. 8 (2011) 935-947 
  21. R.H.R. Castro, P. Hidalgo, D. Gouvêa, J.A.H. Coaquira, J. Rufner, K. van Benthem
    Spontaneous surface excess in chromium doped tin dioxide nanoparticles
    J. Amer. Ceram. Soc. 95 (2011) 170-176 
  22. K. van Benthem, C.S. Bonifacio, C.I. Contescu, N.C. Gallego, S.J. Pennycook
    STEM Imaging of Single Pd Atoms in Activated Carbon Fibers Considered for Hydrogen Storage
    Carbon 49 (2011) 4059-4073 
  23. C.I. Contescu, K. van Benthem, L. Sa, C.S. Bonifacio, S.J. Pennycook, P. Jena, N.C. Gallego
    Single Pd Atoms in Activated Carbon Fibers and their Contribution to Hydrogen Storage
    Carbon 49 (2011) 4050-4058 
  24. L. Huang, C.S. Bonifacio, D. Song, K. van Benthem, A.K Mukherjee, J.M Schoenung
    Nanoscratch-induced room temperature deformation evolution in M-plane sapphire
    Acta Materialia 59 (2011) 5181-5193 
  25. M.A. Harrison, S. Somarajan, S.V. Mahajan, D.S. Koktysh, K. van Benthem, J.H. Dickerson
    Template Assisted Synthesis of Europium Sulfide Nanotubes
    Materials Letters 65 (2011) 420-423 
  26. A. Villa, A. Gaiassi, I. Rossetti, C.L. Bianchi, K. van Benthem, G.M. Veith, L. Prati
    Au on MgAl2O4 spinels: The effect of support surface properties in glycerol oxidation
    Journal of Catalysis 275 (2010) 108-116
  27. T.B. Holland, A.M. Thron, C.S. Bonifacio, A.K. Mukherjee, K. van Benthem
    Field Assisted Sintering of Nickel Nanoparticles During In situ Transmission Electron Microscopy
    Appl. Phys. Lett. 96 (2010) 243106 
  28. S. Kim, P. Jain, H.J. Avila-Paredes, A. Thron, K. van Benthem, and S. Sen
    Strong Immobilization of Charge Carriers near the surface of a Solid Oxide Electrolyte
    Journal of Materials Chemistry
     20 (2010) 3855-3858 
  29. P.F. Becher, N. Shibata, G.S. Painter, F. Averill, K. van Benthem, H.-T. Lin, and S.B. Waters
    Observations on the Influence of Secondary Me Oxide Additives (Me = Si, Al, Mg) on the Microstructural Evolution and Mechanical Behavior of Silicon Nitride Ceramics Containing, RE2O3 (RE = La, Gd, Lu)
    J. Amer. Ceram. Soc. 93 (2010) 570-580 
  30. S.J. Pennycook, M.F. Chisholm, A.R. Lupini, M. Varela, A.Y. Borisevich, M.P. Oxley, W.D. Luo, K. van Benthem, S.H. Oh, D.L. Sales, S.I. Molina, J. Garcia-Barriocanal, C. Leon, J. Santamaria, S.N. Rashkeev, and S. T. Pantelides
    Aberration-Corrected STEM: from Atomic Imaging and Analysis to Solving Energy Problems
    Phil. Trans. R. Soc. A 367 (2009) 3709-3733 
  31. M.L. Redigolo, D.S. Koktysh, K. van Benthem, S.J. Rosenthal, J.H. Dickerson
    Europium sulfide nanoparticles in the sub-2nm size regime
    Mat. Chem and Phys. 115 (2009) 526–529
  32. K. van Benthem and S.J. Pennycook
    Imaging and Spectroscopy of Defects in Semiconductors using Aberration-corrected STEM
    Appl. Phys. A 96 (2009) 161–169 
  33. G.S. Painter, F.W. Averill, P.F. Becher, N.Shibata, K. van Benthem, S.J. Pennycook
    First Principles Study of Rare Earth Adsorption at b-Si3N4 Interfaces
    Phys. Rev. B 78 (2008) 214206
  34. K. van Benthem, G.S. Painter, F.W. Averill, S.J. Pennycook, P.F. Becher
    Atomic ordering and imaging of local bonding strengths at crystalline/amorphous interfaces
    Appl. Phys. Lett. 92 (2008) 163110 
  35. K. van Benthem, S.I. Molina, A.Y. Borisevich, W. Luo, P. Werner, N.D. Zakharov, D. Kumar, S.T. Pantelides, S.J. Pennycook
    Direct Imaging of Impurity Configurations in Silicon Nanowires
    Nano Letters 8 (2008) 1016-1019 
  36. A. Marinopulos, K. van Benthem, S.N. Rashkeev, S.J. Pennycook, S.T. Pantelides
    Impurity segregation and ordering in Si/SiO2/HfO2 structures
    Phys. Rev. B 77 (2008) 195317.
  37. C. Zeng, Z. Zhang, K. van Benthem, M.F. Chisholm, and H.H. Weitering
    Optimal doping control via subsurfactant epitaxy: a new route toward high temperature ferromagnetism in semiconductors
    Phys. Rev. Lett. 100, 066101 (2008).
  38. K. van Benthem and S.J. Pennycook
    Aberration-corrected Scanning Transmission Electron Microscopy for Atomic Scale Characterization of Semiconductor Devices
    Electrochemistry Society Transactions 11 (3), 225 (2007)
  39. A.J. D’Alfonso, S.D. Findlay, M.P. Oxley, S.J. Pennycook, K. van Benthem, L.J. Allen
    Depth sectioning in scanning transmission electron microscopy based on core-loss spectroscopy
    Ultramicroscopy 108, 17 (2007)
  40. M.P. Oxley, M. Varela, T.J. Pennycook, K. van Benthem, S.D. Findlay, L.J. Allen, and S.J. Pennycook
    Interpreting atomic resolution spectroscopic images
    Phys. Rev. B 76, 064303 (2007). 
  41. A.P. Li, C. Zeng, K. van Benthem, M.F. Chisholm, J. Shen, S.V.S. Nageswara Rao, S.K. Dixit, L.C. Feldman, A.G. Petukhov, M. Foygel, and H.H. Weitering
    Dopant segregation and giant magnetoresistance in manganese-doped germanium
    Phys. Rev. B 75, 201201 (2007)
  42. S.T. Pantelides, Sanwu Wang, A. Franceschetti, R. Buczko, M. Di Ventra, S.N. Rashkeev, L. Tsetseris, M.H. Evans, I.G. Batyrev, L.C. Feldman, S. Dhar, K. McDonald, R.A. Weller, R.D. Schrimpf, D.M. Fleetwood, X.J. Zhou, J.R. Williams, C.C. Tin, G.Y. Chung, T. Isaacs-Smith, S.R. Wang, S.J. Pennycook, G. Duscher, K. van Benthem, L.M. Porter,
    Si/SiO2 and SiC/SiO2 Interfaces for MOSFETs – Challenges and Advances
    Mater. Sci. Forum 527-529 (2006) 935-948.
  43. K. van Benthem, G. Tan, R.H. French, L.K. DeNoyer, R. Podgornik, V.A. Parsegian
    Graded Interface Models for more accurate Determination of van-der-Waals – London Dispersion Interactions across Grain Boundaries
    Phys. Rev. B 74, 205110 (2006)
  44. G. Bersuker, C.S. Park, J. Barnett, P.S. Lysaght, P.D. Kirsch, C.D. Young, R. Choi, B.H. Lee, B. Foran, K. van Benthem, S. J. Pennycook, P. M. Lenahan, and J. T. Ryan
    The effect of interfacial layer properties on the performance of Hf-based gate stack devices
    J. Appl. Phys. 100, 094108 (2006)
  45. K. van Benthem, A.R. Lupini, M.P. Oxley, S.D. Findlay, L.J. Allen, S.J. Pennycook
    Three Dimensional ADF Imaging of Individual Atoms by Through-Focal Series Scanning Transmission Electron Microscopy
    Ultramicroscopy 106, 1062 (2006)
  46.  M. Kisa, L. Li, J. C. Yang, T. K. Minton, W. G. Stratton, P. M. Voyles, X. Chen, K. van Benthem, S. J. Pennycook
    Homogeneous Silica Formed by the Oxidation of Si(100) in Hyperthermal Atomic Oxygen
    Journal of Spacecraft and Rockets 43, 431 (2006)
  47. K. van Benthem, C. Elsässer and M. Rühle
    Bonding of thin Pd films on (100)SrTiO3 substrates: Ab-initio density functional theory investigations
    Phys. Rev. B 72, 125435 (2005)
  48. K. van Benthem, M. Kim, S.J. Doh, J.T. Luck, A.R. Lupini, H. Baik, J.-H. Lee, and S. J. Pennycook
    Three-Dimensional Imaging of Individual Hafnium Atoms at a Si/SiO2/HfO2Dielectric Interface
    SAMSUNG Journal of Innovative Technology 1, 335 (2005)
  49. K. van Benthem, A.R. Lupini, M. Kim, H.S. Baik, S.J. Doh, J.-H. Lee, M.P. Oxley, S.D. Findlay, L.J. Allen, and S. J. Pennycook
    Three-Dimensional Imaging of Individual Hafnium Atoms Inside a Semiconductor Device
    Applied Physics Letters 87, 034104 (2005)
  50. K. van Benthem, S.N. Rashkeev and S. J. Pennycook
    Atomic and Electronic Structure Investigations of HfO2/SiO2/Si Gate Stacks Using Aberration-Corrected STEM
    AIP Conference Proceedings 788, 79-84 (2005).
  51. S.N. Rashkeev, K. van Benthem, S.T. Pantelides, and S. J. Pennycook
    Single Hf atoms inside the ultrathin SiO2 interlayer between a HfO2 dielectric film and the Si substrate: How do they modify the interface?
    Microelectronic Engineering 80, 416-419 (2005)
  52. M. Varela, A.R. Lupini, K. van Benthem, A.Y. Borisevich, M.F. Chisholm, N. Shibata, E. Abe, and S. J. Pennycook
    Materials Characterization in the Aberration-Corrected Scanning Transmission Electron Microscope
    Annual Review of Materials Research 2005 35, 539–569 (2005)
  53. M. Kisa, W. G. Stratton, T. K. Minton, K. van Benthem, S. J. Pennycook, P. M. Voyles, X. Chen, L. Li, and J. C. Yang
    Increased Ordering in the Amorphous SiOx due to Hyperthermal Atomic Oxygen Mat. Res. Soc. Symp. Proc. 851, 3 (2005)
  54. K. van Benthem, Y. Peng and S. J. Pennycook
    Tomographic Imaging of Nanocrystals by Aberration-Corrected Scanning Transmission Electron Microscopy
    Mat. Res. Soc. Symp. Proc. 839, 3-7 (2005)
  55. A. R. Lupini, M. F. Chisholm, K. van Benthem, L. J. Allen, M. P. Oxley, S. D. Findlay, M. Varela, S. J. Pennycook
    Limitations to the Measurement of Oxygen Concentrations by HRTEM Imposed by Surface Roughness
    Microscopy and Microanalysis 11, 111-113 (2005)
  56. K. van Benthem, G. Tan, L. K. Denoyer, R. H. French, and M. Rühle
    Local optical properties, electron densities, and London dispersion energies of atomically structured grain boundaries
    Phys. Rev. Lett. 93, 227201 (2004)
  57. Lozano-Castello, R. Kamalakaran, K. van Benthem, Y. Jin-Phillipp, and M. Rühle
    Preparation and characterisation of novel “sea-cucumber”-like structures containing carbon and boron
    Carbon 42, 2223-2231 (2004)
  58. K. van Benthem, C. Elsässer, and M. Rühle
    Core-hole effects on the ELNES of absorption edges in SrTiO3
    Ultramicroscopy 96, 509-522 (2003)
  59. Scheu, M. Gao, K. van Benthem, S. Tsukimoto, S. Schmidt, W. Sigle, G. Richter, and J. Thomas
    Advances in EELS spectroscopy by using new detector and new specimen preparation technologies
    J. of Microscopy 210, 16-24 (2003)
  60. A. Strecker, U. Bäder, M. Kelsch, U. Salzberger, M. Sycha, M. Gao, G. Richter, andK. van Benthem
    Progress in the preparation of cross-sectional TEM specimens by ion-beam thinning
    Z. Metallkd. 94, 290-297 (2003)
  61. K. van Benthem, C. Scheu, W. Sigle, and M. Rühle
    Electronic Structure Investigations of Ni and Cr Films on (100)SrTiO3 Substrates using Electron-Energy-Loss Spectroscopy
    Z. Metallkd. 93, 362-371 (2002)
  62. K. van Benthem, S. Krämer, W. Sigle, and M. Rühle
    Structural and Chemical Analysis of Materials with High Spatial Resolution
    Mikrochimica Acta 138, 181-193 (2002)
  63. K. van Benthem, R. H. French and C. Elsässer
    Bulk Electronic Structure of SrTiO3: Experiment and Theory
    J. Appl. Phys. 90 (12), 6156 (2001)
  64. K. van Benthem, R. H. French, W. Sigle, C. Elsässer, and M. Rühle
    Valence electron energy-loss study of Fe-doped SrTiO3 and a Σ13 grain boundary: electronic structure and dispersion forces
    Ultramicroscopy 86, 303 (2001)
  65. K. van Benthem and H. Kohl
    Methods for ELNES quantification: determination of the degree of inversion of Mg-Al spinels
    Micron 31, 347 (2000)