Book Chapters – Imaging Nanofunctionality

8. K. van Benthem Sintering and TEM: Characterization of Microstructures Before, During and after Densification in: “Novel Sintering Processes, NanoSintering & Grain Growth” R.H.R. Castro, K. van Benthem (eds.) Springer Publishing Group, Heidelberg, New York (2013)

7. K. van Benthem, S.J. Pennycook “Atomic Resolution Characterization of Semiconductor Materials by Aberration-Corrected Transmission Electron Microscopy” in: Comprehensive Semiconductor Science and Technology P.K. Bhattacharya, R. Fornari, S. Mahajan, H. Kamimura (eds.), Vol. 4, pp. 287-304, Elsevier Science & Technology, Oxford, GB (2011)

6. K. van Benthem, S.J. Pennycook “Electron Microscopy of Nanomaterials at very High Resolution” in: Dekker Encyclopedia of Nanoscience and Nanotechnology, 2nd Edition J.A. Schwarz, C.I. Contescu, K. Putyera (eds.), Taylor & Francis, New York (2009)

5. S.J. Pennycook, M.F. Chisholm, A.R. Lupini, M. Varela, K. van Benthem, A.Y. Borisevich, M.P. Oxley, W. Luo, and S. T. Pantelides “Materials Applications of Aberration-corrected Scanning Transmission Electron Microscopy” in: Advances in Imaging and Electron Physics Vol. 153: Aberration-corrected Microscopy Peter W. Hawkes (ed.), Elsevier Academic Press Inc., San Diego (2008)

4. S.J. Pennycook, M.F. Chisholm, K. van Benthem, A.G. Marinopoulos, S.T. Pantelides “From 3D Imaging of Atoms to Macroscopic Device Properties” in: Defects in Microelectronic Materials and Devices D.M. Fleetwood, R.D. Schrimpf, S.T. Pantelides (eds.), SPi Publishing

3. S.T. Pantelides, M.H. Evans, D.M. Fleetwood, E.P. Gusev, J.D. Joannopoulos, Z. Lu, S.J. Pennycook, S.N. Rashkeev, R.D. Schrimpf, L. Tsetseris, K. van Benthem, X-G. Zheng, and X.J. Zhou “Defect-related issues in high-K dielectrics” in: Defects in Advanced High-κ Dielectric Nano-Electronic Semiconductor Devices E. Gusev (ed.), Springer, Amsterdam, 2006, 189-202 (2006)

2. S. J. Pennycook, A. R. Lupini, M. Varela, A. Borisevich, Y. Peng, M. P. Oxley, K. van Benthem, M. F. Chisholm “Scanning Transmission Electron Microscopy for Nanostructure Characterization”, in: Advanced Scanning Microscopy for Nanotechnology W. Zhou and Z.L. Wang (eds.), Springer, 2006

1. A.R. Lupini, S.N. Rashkeev, M. Varela, A.Y. Borisevich, M.P. Oxley, K. van Benthem, Y. Peng, N. de Jonge, G.M. Veith, M.F. Chisholm and S.J. Pennycook “Scanning Transmission Electron Microscopy” in: Nanocharacterization A.I. Kirkland, J.L. Hutchinson (eds.), Royal Society of Chemistry, London, United Kingdom (2007).